| Transmission Electron Microscope Hitachi H-7600 |
Accelerating voltage 120kV Cooling holder (-120℃) |
Chitose Institute of Science and Technology |
| Transmission Electron Microscope Leica ULTRACUT UCT |
Cryostat equipped |
Chitose Institute of Science and Technology |
| High Resolution Transmission Electron Microscope (HRTEM) Hitachi High-Technologies H-9000NAR |
Accelerating voltage 300kV Analytical function：EDS |
Japan Advanced Institute of Science and Technology |
| Transmission Electron Microscope (TEM) Hitachi High-Technologies H-7650 |
Accelerating voltage：120 kV Resolution：0.2 nm (lattice image) 0.36 nm (particle image) Specimen tilting : ±60° |
Japan Advanced Institute of Science and Technology |
| Atom resolution scanning transmission electron microscope JEOL JEM-ARM200F |
Accelerating voltage：200 kV Resolution：0.08 nm (scanning transmission image) 0.19 nm (transmission microscope particle image) 0.10 nm (transmission microscope lattice image) Illuminating system stigmator：built-in |
Japan Advanced Institute of Science and Technology |
| Double Spherical Aberration Corrected Transmission Electron Microscope (Cs-corrected TEM) JEOL JEM-2100F |
Spherical aberration corrector EM-Z07167T Accelerating voltage：80 – 200kV CS lens mounted Analytical function：EELS |
Shinshu University |
| Environmental Transmission Electron Microscope (E-TEM) JEOL JEM-2100 |
Accelerating voltage： – 200kV Gas pressure – 90kPA Temperature – 1500℃ |
Shinshu University |
| Scanning Transmission Electron Microscope (STEM) Hitachi HD-2300A |
Accelerating voltage：200 kV Observation function : Bright-field STEM, Dark-field STEM and others |
Shinshu University |
| High Resolution Transmission Electron Microscope (HRTEM) Hitachi HF-2000 |
Cold cathode field emission, Accelerating voltage 200kV, Resolution：0.1nm、EDX analysis, Slow Scan CCD Camera |
Nagoya Institute of Technology |
| Special Transmission Electron Microscope (TEM) JEOL-JEM2010＋Special specimen stage |
Measurement of nanoscale electric properties using the probe piezo-driving, a mechanical properties evaluation and an evaluation of mechanical properties and its crystalline structure relationship, on site resistor heating |
Nagoya Institute of Technology |
| Atom resolution scanning transmission electron microscope JEOL ARM200F |
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Nagoya Institute of Technology |
| Transmission Electron Microscope JEOL JEM-3100FEF |
300kV, Particle resolution 0.17nm, EELS Microtome |
Institute for Molecular Science |
| Transmission Electron Microscope JOEL JEM-3100FEF |
Accelerating voltage：300kV Analysis Option : ・Scanning Transmission Electron Microscopy ・Elemental analysis using EDS (Energy Dispersive X-ray Spectrometer) ・EELS : (Electron Energy-Loss Spectroscopy) ・Cryostats ・TEM tomography system |
Nara Institute of Science and Technology |
| Transmission Electron Microscope System JOEL JEM-2010 |
Maximum accelerating voltage : 200kV, Point resolution : 0.23nm, Accelerating voltage : 120, 200kV |
Kyushu University |
