Spectroscopy
UV-Vis-NIR Spectroscopy
| UV-near-infrared spectrometer JASCO V-670 | Ultraviolet near-infrared spectrometer Measuring range：190-3200nm | Chitose Institute of Science and Technology |
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| Spectrophotometer Hitachi High-Technologies U-2900 | Wavelength range 190 – 1100nm Spectral bandwidth 1.5nm | NIMS |
| Nanodrop spectrometer Nippon Thermo Nanodrop2000 | NIMS | |
| Agilent 8453 | Nagoya University | |
| Absorption spectrophotometer Shimadzu UV-1800 | Nagoya University | |
| UV-Vis-NIR spectrophotometer JASCO V570 | Absolute reflectance measuring system ARN475 | Nagoya Institute of Technology |
| UV-Vis spectrophotometer JASCO V-550 | Capable of analyzing spectroscopy 190 nm to 1100 nm 1cm cell | Osaka University |
| Spectral Response & Internal Quantum Efficiency Measurement System Bunkoukeiki CEP-2000RR | Nara Institute of Science and Technology | |
| UV-Vis-NIR spectrophotometer Shimadzu SolidSpec-3700DUV | Support DUV measurement, InGaAs detector equipped | Kyushu University |
| UV-Vis-NIR spectrophotometer JASCO V-670 | Capable of measuring up to Abs=7, Support integrating sphere | Kyushu University |
IR Spectroscopy
| Fourier transform infrared spectrophotometer (FT-IR) Shimadzu FTR-8700 | Measuring range : 7800cm-1– 350cm-1 | Chitose Institute of Science and Technology |
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| Infrared Microscope Shimadzu AIM-8800 | Resolution : 1μm | Chitose Institute of Science and Technology |
| Fourier transform infrared spectrometer (FT-IR) JASCO FT/IR-680 Plus | Nagoya University | |
| FT-IR (Fourier Transform – Infrared) spectrometer Bruker IFS66v | Institute for Molecular Science | |
| Fourier transform infrared spectrophotometer (FT-IR) JASCO 6100FV MCT-600 | Wavelength region measurement 0.7μ – 45μm | Osaka University |
| Time-resolved Infrared and Terahertz spectroscopy Marubun Pulse IRS 2000-os | High time resolution of less than 1ps | Osaka University |
Fluorescence spectroscopy
| Fluorescence spectrophotometer Shimadzu RF-5300PC | Fluorescence spectrometer (three-dimensional fluorescence spectrophotometer) Measuring range :220 – 750nm | Chitose Institute of Science and Technology |
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| Fluorescence spectrophotometer Hitachi High-Technologies F-7000 | Excitation wavelength 350nm Wavelength measurement range : 200 – 750nm | NIMS |
| X-ray fluorescence spectrometer Rigaku EDXL 300 | Nagoya University | |
| Fluorescence spectrophotometer JASCO FP-6500 | Nagoya University | |
| PL spectrum ･ PL lifetime measuring instrument self-made | Laser exciter (CW : 405, 532, 596, 633 nm, nS pulse : 532 nm) 470mm single monochromator Deep cooled CCD detector + Photomultiplier Tube Preamplifier, Digital oscilloscope Cryostat (4.2K – 300K) | Nagoya Institute of Technology |
| Near-infrared fluorescence spectrometer Horiba Fluorolog-NIR | Measuring range : 800 to 1600nm (Capable of measuring 300 – 850nm) Capable of installing the temperature controlled cell cooling system (cooled by liquid nitrogen) | Kyushu University |
| Near-infrared fluorescence spectrometer Horiba Jobin Yvon NanoLOG-EXT | Excitation : 700 – 1000 nm Fluorescence : 1100 – 2000 nm | Kyushu University |
| Single-photon counting fluorescence lifetime measuring equipment Hamamatsu Photonics | N2 laser excitation light source (dye laser) | Kyushu University |
Raman spectroscopy
| Microscopic laser spectroscopy system Photon Design PDP-353 | Measurable wavelength range : 0-1000nm | Chitose Institute of Science and Technology |
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| Photon Design RSM-310 | Chitose Institute of Science and Technology | |
| Raman Imaging RENISHAW | Chitose Institute of Science and Technology | |
| Laser Raman microscope Nanophoton Raman plus | Laser : 785nm laser and 532nm laser | NIMS |
| FT-Raman IR spectrometer Perkin Elmer SPECTRUM GX Raman | Spectral range 3600 – 100cm-1 Resolution : 0.2 – 64cm-1 | NIMS |
| Raman scattering analyzing equipment HORIBA-JY T64000 | Japan Advanced Institute of Science and Technology | |
| 3D Microscopic Laser Raman Spectroscopy equipment Tokyo Instruments Nanofinder 30 | Resolution 200 nm (3D image), 80 nm (2D image), 50 nm (Point Measurement) Laser wavelength 442nm, 532nm, 633nm | Japan Advanced Institute of Science and Technology |
| Triple Raman spectrometer Horiba T64000MW / Vis-NIR | Triple monochromator focal length 640mm Laser : Ar, He-Ne, YAG, Ti-Sapphire | Shinshu University |
| Laser Raman spectrophotometer JASCO NRS-1000 | Nagoya University | |
| RENISHAW inVIA Reflex | Institute for Molecular Science | |
| nanophoton | Osaka University | |
| Surface and Interfacial molecular vibrational analysis Spectra-Physics by Tokyo Instruments | Detector : STREAK SCOPE C4334 (Hamamatsu Photonics K.K.) / Detector : Photomultiplier Tube (Hamamatsu Photonics K.K.) / Picoseconds YAG Laser (EKSPLA) Pulse excitation range : 1.5 ps, Excitation wavelength : near 400 nm, With polarization option, Measuring range : 1500 – 4000 cm-1 | Kyushu University |
| nanophoton Raman-touc | ||
| Microprobe type Raman spectrometric measuring equipment Kaiser Optical Systems RAMAN RXN Systems | equipped Laser 785nm / 400mW | Kyushu University |
| Laser Raman Spectrophotometer JASCO NRS-2000 | Measurable range : 40 -8000 cm-1 | Kyushu University |
| Laser Raman Spectrophotometer JASCO NRS-3100KK | Wavelength range : 50 – 8,000 cm-1
Excitation laser wavelength : 532 nm, 785 nm |
Kyushu University |
ICP Emission Spectroscopy
| ICP emission spectrometer Shimadzu ICPE-9000 | Tohoku University |
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Circular dichroism spectroscopy
| Circular dichroism spectrometer JASCO J-725 | Measurable wavelength range : 165 to 1100 nm
Measuring range : 0 to 5 Abs |
NIMS |
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| Electronic circular dichroism spectrometer (ECD) JASCO J-820 | Nagoya University | |
| Electronic circular dichroism spectrometer (ECD) JASCO J-702YS | Nagoya University | |
| Vibrational circular dichroism spectrometer (VCD) JASCO JV-2001YS | Nagoya University | |
| Diffuse reflectance circular dichroism spectrometer (DRCD) JASCO PCD-466 | Nagoya University |
Mössbauer spectroscopy
| Mössbauer spectrometer Laboratory Equipment, Wissel etc (complex system) | 57Fe nucleus, 119Sn nucleus Transmission method, internal conversion electron detection method | Nagoya Institute of Technology |
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Thin Film Ultraviolet – Infrared Reflection
| Contactless optical film thickness measuring system Scientific Computing International Film Tek4000 | Film thickness measuring range : 3nm – 200µm
Measurable wavelength range : 190 to 1700 nm |
Chitose Institute of Science and Technology |
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| Spectroscopic ellipsometer JASCO M-150 | Measurable wavelength range : 250 to 850nm | Chitose Institute of Science and Technology |
| Third‐order nonlinear optical susceptibility measuring apparatus | Nagoya Institute of Technology | |
| Phase modulation spectroscopic ellipsometer Horiba UVISEL LT NIR-NNG | Measurable wavelength range : 190 nm to 2100 nm | Osaka University |
