Other Materials Evaluation
Particle・Molecular size, Zeta Potential, Molecular weight measurement
| Laser Zeta Potential Analyzer Otsuka Electronics ELSZ-1000Z |
NIMS | |
|---|---|---|
| Particle Size Analyzer Shimadzu SALD-2100 |
Measuring range 0.03μm to 1000μm Light source Semiconductor Laser (Wavelength 680 nm) |
NIMS |
| Dynamic Light Scattering Spectrophotometer Otsuka Electronics DLS-8000 |
NIMS | |
| Dynamic Light Scattering Spectrophotometer(DLS) Malvern Zetasizer Nano ZS |
Nagoya University | |
| Particle Size measuring Zeta Potential ･ Particle Size measuring system (Zeta potential, Particle size, Particle size distribution) Otsuka Electronics ELSZ-2 |
Nagoya University | |
| Nanoparticle Tracking Analyzer (Zetasizer) Sysmex NANO-ZS |
Measurable range Concentration 0.1 ppm to 40%/W | Osaka University |
| Zeta Potential / Particle Size Analyzer Otsuka Electronics ELS-Z |
Capable of measuring the Zeta potential on substrate surface | Kyushu University |
| Measurement type of Zetasizer : Particle/Molecular size, Absolute molecular weight, Zeta potential Malvern Nano ZS |
Zeta potential range 3nm – 10mm | Kyushu University |
| Dynamic Light Scattering Spectrophotometer Malvern Zetasizer Nano ZS |
Particle Size Distribution, Zeta Potential, Molecular Weight measuring | Kyushu University |
| Vapor pressure osmometer Gonotec OSMOMAT 070 |
Measurable molecular weight : Toluene : 50 to 50,000 Dalton (g/mol.) Pure water : 50 to 5,000 Dalton (g/mol) | Kyushu University |
| Vapor Pressure Osmometer KNAUER Vapor Pressure Osmometer K-7000 |
Kyushu University |
Thermal Analysis
| Simultaneous Differential and Thermogravimetric Thermal analysis system SII TG/DTA6200 |
Temperature range: Room temperature to 1100°C | Chitose Institute of Science and Technology |
|---|---|---|
| Thermogravimetry measuring equipment(TG) SII TG/DTA6200 |
Nagoya University | |
| Differential Scanning Calorimetry measuring equipment(DSC) SII DSC6200 |
Nagoya University |
Elemental Analysis
| Elemental Analyzer Perkin Elmer 2400 Series II |
CHNS/O, 60 position autosampler | Chitose Institute of Science and Technology |
|---|---|---|
| Automatic Elemental Analyzer Perkin Elmer 2400II CHNS/O |
Organic Element Analyzer CHNS analysis | Nagoya University |
Scanning Transmission X-ray Microscope
| Scanning Transmission X-ray Microscope Bruker UVSOR-II BL4U (100-700eV) utilization |
Spatial Resolution, 30 nm, Atmospheric Conditions Vacuum to Standard Atmospheric Pressure | Institute for Molecular Science |
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Solar Cell Evaluation System
| Bunkoukeiki Solar Simulator (Xenon-arc bulb 150 W) I-V Tester (solar battery output measurement, diode output measurement, environment settings) Hyper Mono Light System (Quantum Efficiency/Spectral Sensitivity Measurement) |
Nagoya Institute of Technology |
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High Molecular Weight Material Analyzers
| Autograph Shimadzu AGS-H |
Autograph Capacity: 1 kN (100 kgf) |
Chitose Institute of Science and Technology |
|---|---|---|
| Dielectric Constant measuring equipment SII DES100 |
Dielectric Constant measuring equipment Measuring range : 3pF-0.1μF |
Chitose Institute of Science and Technology |
| Simultaneous TG-DTA measuring equipment SII TG/DTA6200 |
Temperature range : Room temperature to 1100°C | Chitose Institute of Science and Technology |
| Viscoelasticity Spectrometer SII DMS6100 |
Viscoelasticity Spectrometer Measuring range : 105 to 1012 Pa (Both end support bending) |
Chitose Institute of Science and Technology |
Physical Property Characterization
| Agilent B1500A, B2900A | Tohoku University | |
|---|---|---|
| Absolute PL quantum yields measurement system Hamamatsu Photonics C9920-02G |
Tohoku University | |
| photoexcited carrier mobility measurement Sumitomo Heavy Industories TOF-401 |
Tohoku University |
3D Optical Surface Profiler
| 3D Optical Surface Profiler ZYGO Newview7300 |
Institute for Molecular Science |
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