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Study on advance of SEM images using Nano-suits method and field emission scanning electric microscope (FE-SEM).
Shûhei Nomura
National Museum of Nature and Science, Tokyo, Japan
Sorry, this entry is only available in
Japanese
.
«
Study on ion-implanted layer or deposited films to semiconductor substrate with STEM
(日本語) 画像処理用の光学顕微鏡サンプル撮影
»
Study on advance of SEM images using Nano-suits method and field emission scanning electric microscope (FE-SEM).
Institutes
Chitose Institute of Science and Technology
Tohoku University
National Institute for Materials Science
Shinshu University
Institute for Molecular Science
Nagoya University
Nagoya Institute of Technology
Japan Advanced Institute of Science and Technology
Nara Institute of Science and Technology
Osaka University
Kyushu University
Nanotech Japan
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