Scanning Tunneling Microscope(STM) / Atomic Force Microscope(AFM)
| Scanning near-field optical microscopic spectroscopy system JASCO NFS-230 |
Wavelength resolution：less than 0.5nm Measuring Wavelength：500-1000nm |
Chitose Institute of Science and Technology |
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| Scanning Probe Microscope JEOL JSPM-5200, JSPM-4200 |
Chitose Institute of Science and Technology | |
| Nano-search microscope Shimadzu SFT-3500 |
LSM objective lens: x5、x20、x100 SPM detecting system : optical lever system (pre-mount method by cantilever alignment jig) |
NIMS |
| Atomic Force Microscope (AFM) SII SPI-3800/SPA-400 |
Measuring method: Optical lever method Specimen size: Maximum diameter 35 mmφ Maximum thickness 10 mm Scanning field 20μm |
Japan Advanced Institute of Science and Technology |
| Thickness measurement of macromolecular nano scale thin film(Simplified atomic force microscope) SII NPX2100 |
Nagoya University | |
| Thin film surface observation (Atomic Force Microscope) Asylum MFP-3D |
Nagoya University | |
| Atomic Force Microscope Veeco Instruments Nanoscope IIIa |
Nagoya University | |
| Atomic Force Microscope Shimadzu FTM-9600 |
contact mode, dynamic mode, phase mode, current mode, horizontal force mode, magnetic force mode, surface potential mode Resolution：horizontal 0.2nm, vertical 0.01 nm |
Nagoya Institute of Technology |
| Precision contour measurement with AFM (Atomic Force Microscope), Point measurement with MFM(Magnetic Force Microscope), Point Electric properties measurement JEOL Special model JSPM-5200TM |
Resolution : Atomic resolution, CNF probe equipped Measuring mode : dimension, electric property, magnetic property measurement |
Nagoya Institute of Technology |
| Environmental controlled scanning probe microscope system Hitachi High-Tech Science NanoNaviⅡ/SPA-300HV |
Vacuum：～10-5Pa, Various gas atmospheres Resolution : 0.3 nm Specimen temperature : -120 – 300℃ Visible in liquid Specimen size : max 2inch |
Osaka University |
| Hitachi High-Tech Science NanoNaviReal/E-Sweep | Osaka University | |
| Scanning Probe Microscope Agilent Technologies PicoPlus 5500 |
Horizontal resolution : 0.14 nm, Vertical resolution : 0.01 nm | Kyushu University |
| Scanning Probe Microscope (SPM) Shimadzu SPM9600 |
Resolution : Horizontal 0.2 nm Vertical : 0.01 nm Measuring mode : contact, dynamic, phase |
Kyushu University |
| Multi-functional scanning probe microscope with environmental unit SII-NT SPA300HV |
Observation with Atomic Force Microscopy (contacting and tapping), Observation of lateral force (friction force) with Lateral Force Microscope, Temperature variation observation, Viscoelastic mode observation, observation in the atmosphere, observation in a vacuum, observation in the liquid | Kyushu University |
| Environmental controlled multi-function scanning probe microscope SII-NT SPI3800N |
Environment : atmosphere, liquid, vacuum, gas atmosphere Temperature control : automatic heating / cooling (-120 to 250℃) Measuring mode : phase, friction, viscoelasticity, current, etc. |
Kyushu University |
| Scanning probe microscope system Vecco Nanoscopellla |
Kyushu University | |
| Scanning probe microscope system Vecco Nanoscopellla |
Kyushu University | |
| Surface resistivity meter Mitsubishi Chemical Loresta-GP |
4 probe 4 terminal method, Constant current application system, Measuring range : 10-3～107Ω |
Kyushu University |
| Stylus Surface Profiler ULVAC Dektak 6M |
Chitose Institute of Science and Technology | |
| Stylus Surface Profiler Bruker DektakXT-A |
Osaka University | |
| Surface roughness measuring equipment Vecco Dektak 6M |
Vertical resolution: 1Å – 40Å | Kyushu University |
